Morphology/Structural Characterization

Lab 1 Raman spectroscopy, Photoluminescence, X-Ray Diffraction, SEM microscopy

Structural and optical characterization of materials, in particular of the PLD films, will be carried out by means of Scanning Electron Microscopy, X-ray diffraction Raman spectroscopy and photoluminescence spectroscopy, with the possibility of using different laser excitation wavelengths.

High resolution Scanning Electron Microscopy will be carried out in collaboration with the Micro and Nanostructured Materials Laboratory (Department of Energy, Politecnico di Milano) by means of a Field Emission SEM Zeiss Supra 40 (max resolution 1 nm) with STEM detector and EDS for chemical analysis